Atomic-scale Imaging of Surfaces and Interfaces: Symposium Held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.D. K. Biegelsen, David J. Smith, S. Y. Tong Materials tunneling microscopy for hydrogen-desorption-induced structural change of Si(111) surface; Steps on the (110) surface InP; Scanning tunneling microscopy on charge density waves in layered compounds; Design of ultra high vacuum scanning electron microscope combined with scanning tunneling microscope; Scanning tunneling microscopy perspective of structures on reduced SrTiO3(001) surfaces; Surface structure and electronic property of reduced SrTiO3(100) surface observed by STM/STS; Metastable structural surface excitations and concerted adatom motions: a STM study of atomic motions within a semiconductor surface; Mechanisms and energetics of surface atomic processes: an atom-probe field ion microscope study; Atomic arrangement of Al near the phase boundaries between square root 3X square root 3-Al and 7X7 structures on Si(111) surfaces; Growth and surface morphology of thin silicon films using an atomic force microscope; Solving interface structures by combined electron microscopy and X-ray diffraction; Quantitative hrem study of the atomic structure of the sum(310)/[001] symmetric tilt grain boundary in Nb; Hrtem observation of a sum =3 \{112\} bicrystal boundary in aluminum; Atomic structure of the (310) twin in niobium; theoretical predictions and comparison with experimental observation; Quantitative high-resolution electron microscopy of grain boundaries in gamma-Al2=3; Comparisons of observed and simulated atomic structures of Pd/NiO heterophase interfaces; Atomic structure of sum =5 (130) symmetrical tilt boundary in strontium titanate; Assessment of GaInAs/GaInAsP interdiffusion profiles obtained using stem-edx and hrem; Electron microscopy characterization of epitaxial growth of Ag deposited on MgO microcubes; Real-time viewinf of dynamic processes on CdTe surfaces at elevated temperature; AFM imaging of the crystalline-to-amorphous transition on the surface of ion-implanted mica; AFM imagings of ferritin molecules bound to LB films of poly-1-benzyl-L-histidine; Artifacts in atomic force microscopy of nanoporous and mesoporous fiducial samples; Al induced reconstructions on the Si(111) surfaces studied by scanning tunneling microscopy; Structure of the sum =3 (111) grain boundary in Cu-1.5%Sb; High resolution electron microscopy of sum =3 NiSi2 (111)/(115) Si and NiSi2(221)/(001)Si interfaces; Image simulations of Ge twin boundaries; Surface structure of oxide catalyst microcrystals: high resolution electron microscopy study; A microstructural study of reaction-bonded silicon carbide... |
Contents
SCANNING TUNNELING MICROSCOPY FOR HYDROGENDESORPTION | 3 |
STEPS ON THE 110 SURFACE OF InP | 9 |
SCANNING TUNNELING MICROSCOPY ON CHARGE DENSITY WAVES | 15 |
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1993 Materials Research adatoms AFM images amorphous analysis angle annealing atom probe atomic columns atomic force microscope atomic structure Auger bicrystal calculated contrast crystal dangling bonds defects defocus density deposition diffraction diffusion dimer dislocation domain electron beam electron microscopy energy epitaxial experimental images facet ferritin field ion field ion microscopy film grain boundary HREM image image simulations indicated inelastic intensity interdiffusion interface ISBN Lett Materials Research Society measured metal MgO cube MGPT micrograph NiSi2 observed obtained orientation oxide oxygen parameters particles Pb atom PBLH phase Phys positions probe Proc reconstruction region relaxation RHEED sample scanning tunneling scanning tunneling microscopy scattering shift shown in Figure shows silicon simulated image spatial resolution specimen steps STM image streaks substrate supercell symmetry Symp technique temperature thickness tilt transmission electron microscopy unit cell X-ray