High Brightness Field Emission Electron Probe Forming Systems |
Contents
CHAPTER II | 8 |
THEORETICAL CONSIDERATION OF A GENERAL ELECTRON BEAM | 33 |
CHAPTER IV | 69 |
5 other sections not shown
Common terms and phrases
accelerating voltage acceptance angle amp/cm² amps angular current density aperture angle astigmatism beam divergence beam forming system Chapter chromatic aberration coefficients coherence length condenser lens cross-over defined deflectors diameter divergence angle effective source radius einzel lens electron beam electron optical properties electrostatic system energy spread Experimental field emission anode field emission electron field emission gun field emission source field emission system field emission voltage flicker noise focal point geometry high resolution HREM illuminating system lenses linear magnification magnetic field magnetic lens magnetic pre-accelerator lens method microscope modaya nitrogen processing objective lens obtained operating optimization Phys pole pieces probe forming system processed tip projector lens radians razor edge reduced brightness Septier shown in Figure specimen spherical aberration spherical and chromatic spot temperature theoretical thermionic source thermionic system Torr transfer lens transmission electron microscopy tungsten field emitter vacuum Veneklasen 1971 voltage ratio