Proceedings: Seventh National Symposium on Reliability & Quality Control in Electronics, Philadelphia, Pa., January 9-11, 1961 |
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accelerated accelerated life test acceptance Aircraft analysis application basic bility capacitors circuit component considered corrective action cost curve cycle density design review determine distribution effect effort electrical Electronic Equipment environmental equation established estimate evaluation example exponential exponential distribution factors failed failure probability failure rate Figure force of mortality function geometric distribution germanium given increase limits lognormal lognormal distribution maintenance malfunction manufacturing mathematical mean ment method MTBF negative binomial distribution normal number of failures obtained operation paper parameter performance phase problem procedure product reliability progressive stress Quality Control ratio redundancy relia reliabil Reliability and Quality reliability education Reliability Engineering reliability program reliability requirements reliability test repair Report sampling plans Sandia Sandia Corporation specification standard deviation statistical steady stress subsystem system reliability Table techniques temperature tion transistor tubes units USAF variable voltage Weapons Systems