Techniques of Electron Microscopy, Diffraction, and Microprobe Analysis, Volume 5 |
Contents
Introduction | 1 |
Application of a Conducting Mask for Thinning Metallic Foils for Electron Trans | 24 |
Microconstituents in HighSpeed SteelP K Koh and H Nikkel | 44 |
Copyright | |
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Common terms and phrases
alloy anhydrite as-cast ASTM austenite Blu/Au Blu/B Blu/N calcite calcium carbon cards of Deck chemical chromium coincident holes components compounds copper corrosion crack propagation current density cutting d values d-value interval damage data cards data File decohesion deformation delta ferrite descriptor diffraction data electron diffraction electron diffraction patterns Electron image electron microscopy electropolishing entries etched ferrite final magnification final thinning Fink index Fractograph fracture face Frevel heat treatment high intensity lines high-speed steel hole location identification index cards indicate listed martensite material Matthews index MC carbide metal metallographic micro microfissures microprobe microscope microstructure mixture negative d-value cards Oscilloscope Oscilloscope trace showing OXIDE particles phase polishing positive d-value cards powder diffraction precipitation Prime Film punched ray diffraction regions relative intensities replica SAMARIUM search procedure shown in Fig solution spark specimen stainless steel stress-corrosion cracking supersonic transport Table tabs techniques thickness tion titanium unknown pattern washers x-ray