X-ray Analysis PapersWilliam Parrish |
Contents
FILTER AND CRYSTAL MONOCHROMATOR TECHNIQUES | 31 |
COMPARISON OF XRAY WAVELENGTHS FOR POWDER | 47 |
THE NORELCO XRAY DIFFRACTOMETER | 71 |
Copyright | |
20 other sections not shown
Common terms and phrases
aberrations absorption edge accuracy Acta Cryst analyzing crystal angular aperture atomic number axis background beryllium Bragg angle Bragg equation calibration camera collimator constant counter tube counting rate crystal monochromator crystallite CuKa curve decreasing detector determined diffractometer effect electron elements energy excitation factor film filter fluorescence focal spot focusing foil Geiger counter goniometer increase Instr instrument intensity measurements lattice parameters limited line intensity line profiles Lowitzsch method monochromator Norelco obtained orientation P/B ratio Parrish pattern peak intensity peak-to-background ratio Philips Tech Phys plane precision primary beam proportional counter pulse height analysis quartz radiation rays receiving slit reciprocal lattice recorded reflection angle resolution rotation sample scanning speed scintillation counter shown in Fig silicon Soller collimator spectral spectrograph spectrometer spectrum Table target technique thick tion tungsten values voltage wavelength width window X-ray beam X-ray diffraction X-ray optics X-ray spectrochemical analysis X-ray tube