Electron microscopy: principles and fundamentals
VCH, 1997 - Science - 515 pages
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
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Electron Microscopy for Materials Arizona State University
Tempe AZ 852871504
Oleshko Vladimir Gijbels Renaat Technology
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aberration Amelinckx amplitude analysis angle atoms Auger Auger electrons boundary Bragg Bragg angle bright field Burgers vector coherent column contrast crystal CTEM dark field image defects defocus detector diffracted beams diffraction pattern domain domain walls edge EELS effect electron beam electron diffraction electron microscope emission energy loss factor Figure foil Fourier fringes high-resolution hologram holography HOLZ image plane incident beam inelastic instrument intensity interface J. M. Cowley lattice planes layer LEEM magnetic method Microsc mode objective lens obtained optical orientation parallel parameters partial dislocations particles phase Phys pixel potential probe profiles reciprocal lattice reciprocal space reflection region resolution result sample scanning scattering screw dislocation secondary electrons shown in Fig shows signal silicon spatial specimen spectra spherical aberration stacking fault stacking fault energy STEM structure surface symmetry techniques thickness thin tion transmission electron microscope tron Ultramicroscopy voltage wave wavefunction X-ray