Advances in Imaging and Electron Physics, Volume 118 (Google eBook)

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Academic Press, Sep 25, 2001 - Technology & Engineering - 281 pages
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Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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Chapter 2 Noninterferometric Phase Determination
Chapter 3 Recent Developments of Probes for Scanning Probe Microscopy
Chapter 4 Morphological Image Enhancement and Segmentation

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About the author (2001)

Center National de la Recherche Scientifique, Toulouse, France

Xerox Corporation, Palo Alto, California

Aston University, Birmingham, U.K.

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