LSI & Boards: Digest of Papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, Held at Cherry Hill, New Jersey |
Common terms and phrases
algorithm analysis applied approach assembly automated automatic test board test buffer capability chip circuit boards circuitry clock complex components cycle delay detection device under test diagnostic digital circuit driver dynamic engineer error example failure fault coverage flip flops functional test gate hardware IEEE in-circuit testing input instruction integrated circuit load logic LSI boards LSI devices manual manufacturing measure memory board method microprocessor mode modules node operation output parameters performance pins power supply printed circuit boards probe problem processor pulse repair Scan SCAN-PATH scan/set self-test sequence shift register SHMOO plot shown in Figure signal signature simulation specific speed SSI/MSI strobe subassembly subroutine system test technique Teradyne test cost test equipment test pattern test program test system testability tester tion truth table vector voltage