## Measurement for Progress in Science and Technology: Acta IMEKO 1979 : Proceedings of the 8th IMEKO Congress of the International Measurement Confederation Held from the 21st to the 27th May 1979, Moscow, USSR, Volume 1 |

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### Contents

The influence of microprocessor technology on instrument and system | 3 |

Principles of computerized measuring | 19 |

Review of developments in the design and application of process | 47 |

Copyright | |

28 other sections not shown

### Common terms and phrases

accuracy ACTA IMEKO 1979 algorithm amplitude application autocorrelation beam calculation calibration characteristics chemical circuit coefficients coldworking comparator components confidence interval coordinates corresponding curve defined determined diagram digital filter distance distribution electronic elements equation equivalence relation estimation example Figure frequency fringe pattern function hardware industry interface interferometer interval Keywords laser length linear magnetic mathematical means meas measurable properties measurand measurement process measurement theory measurement uncertainty measuring computing complex measuring devices measuring instrument measuring system ment method metrological microcomputer microprocessors minicomputer modulation moire moire topography obtained operation optical optimal output signal parameters photodetector possible precision problem procedure process analyser processor Prof quantizer random range realized relation resonant wire retroreflectors sampling sensor shown spectral standard statistical strain gauges structure surface surface plates theoretical theory of measurement tion transducer transformation uncertainty voltage wavelength