Journal de physique: Proceedings

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EDP Sciences, 2006 - Physics
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Comparison of the freezeout effect in In and B doped nMOSFETs in the range 4 2 300
A thorough analysis of selfheating effects for SOI MOSFETs on SIMOX
The drainbiasvariable characteristics of exponent y on 1f noise in DDD wMOSFETs

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