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aberration alloy amorphous analysis angle annealing aperture atoms axis Bloch wave Burgers vector calculated carbon clusters contrast corresponding CTEM damage dark field defect defocus deformation density detector determined diameter diffraction pattern diffusion dislocation loops distribution domain domain wall effect electron beam electron diffraction energy loss experimental field emission Fig.l Figure film fringes function grain boundary high resolution holography increased intensity interface interstitial investigated irradiation lattice images layer magnetic martensite material matrix measured metal method micrographs microscope nucleation objective lens observed obtained optical orientation oxide p-n junction parameters particles phase Phil Phys plane precipitate probe Proc region sample scanning electron microscope scattering selected area diffraction shown in Fig shows silicon single crystal spatial specimen spherical aberration spots STEM strain structure substrate surface technique temperature thickness tilt tion transmission electron microscopy tungsten twin vacuum voltage X-ray zone