Proceedings of a Specialist Workshop in Analytical Electron Microscopy Held at Cornell University, Ithaca, N.Y., July 25th-28th, 19781978 - Electron microscopes - 354 pages |
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Page 180
... detector observation angle1 of 85 ° relative to the forward scat- tering direction which is the best geometry currently attainable in this instrument . A lead collimator was used to shield the detector from back- scattered electrons as ...
... detector observation angle1 of 85 ° relative to the forward scat- tering direction which is the best geometry currently attainable in this instrument . A lead collimator was used to shield the detector from back- scattered electrons as ...
Page 281
... detector at the beam exit side of the specimen in the STEM is easily interpretable , since the signal from this detector is mainly due to elastic scattering and , given the appropriate geometry , phase contrast effects can be made ...
... detector at the beam exit side of the specimen in the STEM is easily interpretable , since the signal from this detector is mainly due to elastic scattering and , given the appropriate geometry , phase contrast effects can be made ...
Page 340
... detectors for both imaging and analysis . the case of EDS , a compromise must be made between a large detector de- signed to collect a large fraction of the solid angle of emitted X - rays and a highly collimated detector which would ...
... detectors for both imaging and analysis . the case of EDS , a compromise must be made between a large detector de- signed to collect a large fraction of the solid angle of emitted X - rays and a highly collimated detector which would ...
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aberrations analysis aperture background beam spreading bremsstrahlung calculations carbon cathodoluminescence chromatic aberration Cornell count cross section crystal CTEM dark field density detection detector diffraction pattern diffusion discussion display dose edge effects Egerton elastic scattering electron beam electron diffraction electron energy loss elements EXAFS excitation exciton experimental field emission gun Figure film function incident electron increase inelastic instrument intensity interface irradiation Isaacson K-edge lattice imaging Leapman lens limit magnetic Materials Science measured microcomputer microdiffraction micrograph microscope mode molecules Monte Carlo mrad multiple scattering objective lens obtained operating optical P/B ratio parameters peak photomultiplier Phys plane plasmon probe problem Proc processing quantitative radiation damage ratio recorded region sample Scanning Electron Microscopy shown signal Silcox spatial resolution specimen spectra spectrometer spectroscopy spectrum structure surface techniques temperature thickness tilt tion torr transmission electron microscope Ultramicroscopy vacuum