Proceedings of a Specialist Workshop in Analytical Electron Microscopy Held at Cornell University, Ithaca, N.Y., July 25th-28th, 19781978 - Electron microscopes - 354 pages |
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aberrations analysis aperture background beam spreading bremsstrahlung calculations carbon cathodoluminescence chromatic aberration Cornell count cross section crystal CTEM dark field density detection detector diffraction pattern diffusion discussion display dose edge effects Egerton elastic scattering electron beam electron diffraction electron energy loss elements EXAFS excitation exciton experimental field emission gun Figure film function incident electron increase inelastic instrument intensity interface irradiation Isaacson K-edge lattice imaging Leapman lens limit magnetic Materials Science measured microcomputer microdiffraction micrograph microscope mode molecules Monte Carlo mrad multiple scattering objective lens obtained operating optical P/B ratio parameters peak photomultiplier Phys plane plasmon probe problem Proc processing quantitative radiation damage ratio recorded region sample Scanning Electron Microscopy shown signal Silcox spatial resolution specimen spectra spectrometer spectroscopy spectrum structure surface techniques temperature thickness tilt tion torr transmission electron microscope Ultramicroscopy vacuum