Characterization of Very High Speed Semiconductor Devices and Integrated Circuits: 23-25 March 1987, Bay Point, Florida, Volume 795

Front Cover
Ravi Jain
SPIE, 1987 - Technology & Engineering - 359 pages
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Contents

Critical Reviews of Optical Science and Technology
vii
68 High electron mobility transistors for millimeter wave and high speed digital IC
67
120 Electrical sampling techniques
132
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