Characterization of Very High Speed Semiconductor Devices and Integrated Circuits: 23-25 March 1987, Bay Point, Florida

Front Cover
Ravi Jain
SPIE, 1987 - Technology & Engineering - 359 pages

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Contents

68 High electron mobility transistors for millimeter wave and high speed digital IC
67
Testing monolithic GaAs MMIC circuits
103
120 Electrical sampling techniques
132
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