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A. H. Sher absorption adhesion aluminum film aluminum wire apparatus ASTM Committee F-l capacitance capacitor microphone characteristics circuits collector-emitter voltage Computer curve determine diameter diffusion diodes electrical epitaxial epitaxial layers F. F. Oettinger fabricated Fano factor four-probe method frequency ft-cm gamma-ray Ge(Li germanium germanium and silicon Hall effect helium mass spectrometer hot spot improved impurity indium antimonide INHOMOGENEITIES JEDEC laser interferometer meas Measurement for Semiconductor measurement methods methods of measurement microwave mount NBS Tech nomographs photoconductive Photomasking photovoltaic Power Transistors procedure radial resistivity radius resistivity measurements resistivity profile resonance round robin scanning scanning electron microscope scattering parameters scratch test Section semiconductor devices Semiconductor Materials Sheet Resistivity shown in Fig silicon crystals silicon wafers specimen standing wave stylus substrate surface tapered Technical techniques temperature test methods thermal thick transistor ultrasonic microphone W. M. Bullis W. R. Thurber WIRE BOND EVALUATION