UGIM-83: Proceedings, May 25, 26, and 27, 1983, Texas A & M University, College Station, Texas |
Contents
FOREWORD | 8 |
Public Policy and Cooperative Research Efforts Chairwoman Ruth Davis | 17 |
Governmental Support of Microelectronics Research | 23 |
Copyright | |
5 other sections not shown
Common terms and phrases
1/f noise 3D CMOS base bias burst noise CAD tools chip design circuit design CMOS components course DARPA density design methodology design rules dopant effects Electrical Engineering electron electron mobility etch experimental fabrication process facility Figure function GaAs gate array height burst noise IEEE implant implementation industry input integrated circuit interconnect interface laboratory laser layer layout library cells logic design logic simulation manufacturing mask MCNC Mead-Conway measurements metal Microelectronic Engineering micron mobility MOSFET output oxide p-n junctions p-well package parameters performance phonon photomask planarization poly polysilicon production projects pulse width resistor SEMICONDUCTOR RESEARCH CORPORATION sheet resistance shown in Fig signal silicon Solid State Electronics substrate techniques test chip test pattern test structure testability thick film resistors tion transistor transmission line University VLSI design voltage wafer Zachry Engineering Center