Electron Optics and Electron MicroscopyGood,No Highlights,No Markup,all pages are intact, Slight Shelfwear,may have the corners slightly dented, may have slight color changes/slightly damaged spine. |
Contents
THE ELECTRON LENS | 27 |
THE ELECTRON MICROSCOPE | 83 |
SCANNING ELECTRON MICROSCOPY | 163 |
Copyright | |
2 other sections not shown
Common terms and phrases
accelerating voltage amplitude analyser angle ångströms anode asymptotic atomic number axis Boersch Cavendish Laboratory chromatic aberration coils components condenser conjugate contrast corresponding crossover crystal curves deflected denotes diffraction diffraction pattern effect electron beam electron gun electron lenses electron optics electrostatic lens energy filament final image fluorescent screen focal length Fourier transform frequency function illumination image plane incident electron instrument intermediate lens Laboratory limit of resolution magnetic field magnetic lenses magnification micro microanalyser micrograph object plane objective aperture objective lens obtained paraxial pass phase Plate pole-pieces potential principal plane probe produced projector properties quadrupole rays rotational scanning electron microscope scanning microscope scattering secondary electron Siemens specimen spectrum spherical aberration spherical aberration coefficient stigmator structure superconducting surface thick thin tion trajectory equations transmission electron microscope wave wavelength wehnelt Wien filter X-ray zero