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amplifier analog ap/p apparatus Appl applied bandgap boundary calculated capacitance charge carrier circuit components conduction band constant contacts corresponding crystal current density current streamlines curve dependence depletion described determined effective mass electric field electrometer electron mobility epitaxial layer equation error experimental measurements four-point probe four-probe frequency function GaAs galvanomagnetic gate voltage Hall angle Hall coefficient Hall current Hall effect Hall effect measurements Hall field Hall measurements Hall plate Hall voltage heat impurity inhomogeneities input InSb Instr insulators interface magnetic field magnetoresistance material metal method module n-type n-type semiconductor Nernst Nernst effect ohm-cm ohms output p-n junction parameters Phys polarity potential difference potential probes ratio rectangular resistivity measurements sample scattering Seebeck coefficient semiconductor sheet resistivity shown in Fig signal silicon Solid-State Electron space charge specimen spreading resistance switch techniques tensor thermal thermocouple thermoelectric thickness transverse voltmeter wafer width