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The Electron Microscopical Object
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amplitude amplitude object angle astigmatism axis beam splitter Boersch calculations camera components contrast aperture contrast transfer functions coordinate cross-over defocusing diameter diffraction pattern dispersion distribution effect electron beam electron optical electrostatic lens energy analysing energy loss equation exit pupil exposure eyepiece field of view film filter focal Fourier Hanszen illumination image plane image processing incident inclusions instrument intensity light detector limited linear magnetic prism magnification measured micrograph mirror electron microscope modulation noise object point objective aperture objective lens obtained parameters perturbation phase contrast phase modulation phase object photographic photomicrography photomultiplier photoresistor Phys picture plasmon plate pole pieces prism pupil plane Quantimet reflected electrons region resolution scan screen Section shown in Fig spatial frequency specimen surface spectra spectrum spherical aberration stigmatic trajectories transfer interval transparency tube voltage wave aberration wave function weak objects width x1 curve zero zone plates