Introduction to Scanning Tunneling Microscopy (Google eBook)

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Oxford University Press, May 11, 1993 - Science - 472 pages
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Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
  

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Contents

I
xvii
II
1
III
3
IV
10
V
21
VI
26
VII
32
VIII
36
LVIII
242
LIX
244
LX
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LXI
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LXII
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LXIII
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LXIV
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LXV
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IX
38
X
51
XI
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XII
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XIII
56
XIV
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XV
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XVI
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XIX
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XX
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XXX
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XXXI
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L
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LVI
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LXVII
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LXXI
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LXXXI
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XCIX
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C
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CI
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CII
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CVI
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CIX
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CX
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CXI
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CXIII
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Page vi - The Frontiers of Knowledge (to coin a phrase) are always on the move. Today's discovery will tomorrow be part of the mental furniture of every research worker. By the end of next week it will be in every course of graduate lectures. Within the month there will be a clamour to have it in the undergraduate curriculum. Next year, I do believe, it will seem so commonplace that it may be assumed to be known by every schoolboy.
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