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A. H. Sher absorption adhesion aluminum film aluminum wire apparatus ASTM Committee F-l Bureau of Standards capacitance capacitor microphone characteristics circuits collector-emitter voltage Computer critical load curve determine diameter diffusion diodes electrical epitaxial epitaxial layers F. F. Oettinger fabricated Fano factor fi-cm four-probe method frequency ft-cm gamma-ray Ge(Li germanium germanium and silicon Hall effect helium mass spectrometer hot spot improved impurity indium antimonide JEDEC laser interferometer meas Measurement for Semiconductor measurement methods methods of measurement mount NBS Tech nomographs photoconductive Photomasking photovoltaic Power Transistors procedure radial resistivity resistivity profile resonance round robin scanning scanning electron microscope scattering parameters scratch test Section semiconductor devices Semiconductor Materials Sheet Resistivity shown in Fig silicon crystals silicon wafers specimen standing wave stylus substrate surface tapered Technical techniques temperature test methods thermal thick transistor ultrasonic microphone W. M. Bullis W. R. Thurber WIRE BOND EVALUATION