Aberration-corrected Analytical Electron Microscopy
Wiley, Jul 18, 2011 - Science - 296 pages
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).
What people are saying - Write a review
We haven't found any reviews in the usual places.
The Application of Aberration-corrected Electron Microscopy to the ...
Andrew A. Herzing
No preview available - 2007
Low Voltage Electron Microscopy: Principles and Applications
David C. Bell,Natasha Erdman
Limited preview - 2012