Optical constants of materials for UV to X-ray wavelengths: 4-5 August, 2004, Denver, Colorado, USA
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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Numerical Recipes in C: The Art of Scientific Computing, Book 4
William H. Press
Limited preview - 1992
SCANDIUM AND RELATED ELEMENTS
Determining rutheniums optical constants in the spectral range 1114 nm 553811
Direct index of refraction measurement of silicon and ruthenium at EUV wavelengths
7 other sections not shown
absorption band absorption edge Advanced Light Source angle of incidence atomic attenuation coefficient beam current beam energies beamline calculated calibration carbon correction CXRO deposition detector determined electron energy range equation error EUV region experimental extinction coefficient extreme ultraviolet Figure filter flatfield function grating Henke index of refraction instrument iridium irradiance Kramers-Kronig layer linear linear-polarizer mass attenuation coefficient mirrors Mo/Y multilayers National Laboratory near-edge niobium nm wavelength normal incidence obtained optical properties order QT overlayer parameters peak photodiodes photon photon energy Phys polarization reflectance measurements reflectometer refractive index Regina Soufli rock rocket EGS rocket flight sample Sc films Scandium scattered light Seely shales shown in Fig silicon soft x-ray solar Soufli spectral range Spectroscopy spectrum substrate SURF-III surface synchrotron radiation thickness thin films transmission transmittance measurements uranium nitride uranium oxide vacuum values wavelength wavelength range Windt yttrium zirconium