Measurement of High-speed Signals in Solid State DevicesRobert B. Marcus Annotation Operating speeds near 1 ps and dimensions well below 1 micron dictate the need for non-invasive probes. This book discusses the current status of methods developed to perform such measurements. Most of the techniques are "contactless" and most make use of sampling methods requiring synchronization and signal averaging to obtain a satisfactory signal-to-noise ratio. Discusses photoconductive, electrooptic, electron beam, photoemissive probing, contact probing. Annotation copyrighted by Book News, Inc., Portland, OR. |
