Defect recognition and image processing in III-V compounds: proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985

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Elsevier, 1985 - Technology & Engineering - 306 pages
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Contents

Infrared tomography for detection of lattice defects in III V compound
1
Observation of microdefects in GaAs crystals by infrared light scattering
27
Infrared scattered light and processed images of defects in GaAs wafers
35
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