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Instrumentation for Cryosectioning
Cryoprotection on Organic Specimens
36 other sections not shown
analysis angle aperture application astigmatism atoms averaging axial axis backscattered biological Boersch calculated carbon cathode cell chromatic aberration crystal CTEM density detector diameter diffraction pattern diffractograms distribution dose edge electron beam electron diffraction electron energy electron gun Electron Microscopy electron optical elements energy loss experimental Fig.l Figure film filter foil Fourier Fourier transform function high resolution illumination image processing intensity Kogakuin University lattice layer lenses magnetic magnification measured method microanalysis Microsc microscope mode molecules noise objective lens observed obtained Optik parameters particles peak phase contrast Phys pixel plane polepiece Proc quantitative ratio reconstruction recording sample scanning electron scanning electron microscope scattering sections shown in Fig shows signal Somlyo spatial specimen spectra spectrometer spectrum spherical aberration sputter deposition STEM structure surface technique temperature thickness thin tilt tion transmission electron microscope Ultramicroscopy vacuum values voltage wave X-ray