IEEE 1986 Ultrasonics Symposium: Proceedings ; November 17-19, 1986, Colonial Williamsburg Conference Center, Williamsburg, VA, Volume 2 |
Contents
EE1 Invited Ultrasonic Techniques in | 627 |
111 | 633 |
EE5 Determination of Case Depth in Small | 639 |
Copyright | |
20 other sections not shown
Common terms and phrases
acoustic impedance acoustic microscope acoustic waves adhesion amplitude analysis aperture applied array attenuation average B-mode B-scan backscatter bandwidth beam calculated cavitation ceramic coefficient coherent components composite constant curve delay noise dependence devices diameter diffraction distance domain Doppler echo effect electrode element equation experimental ferroelastic Ferroelectrics fiber Figure film focal focused fracture frequency function hydrophone Hyperthermia IEEE IEEE Trans intensity interface layer lead titanate lens linear liver material matrix measured mechanical method mode modulation nonlinear acoustic normal obtained optical optical fiber output phase phase modulation Phys piezoelectric plane probe processing propagation pulse radiation Rayleigh Rayleigh wave reflection region resolution resonance response sample scan scattering shear shown in Fig shows signal simulator sonoluminescence spatial specimen speckle spectra spectrum structure substrate surface surface acoustic wave technique temperature thickness tion tissue transducer transmitted ultrasound variation velocity vibration voltage waveform wavelength