Specimen preparation for transmission electron microscopy of materials III: symposium held December 5-6, 1991, Boston, Mass., U.S.A.

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Materials Research Society, Apr 3, 1992 - Science - 288 pages
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Contents

ACKNOWLEDGMENT xl
3
FIBXTEMFOCUSSED ION BEAM MILLING FOR TEM SAMPLE
23
PRECISION ION POLISHING SYSTEMA NEW INSTRUMENT
43
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