Specimen Preparation for Transmission Electron Microscopy of Materials III: Symposium Held December 5-6, 1991, Boston, Mass., U.S.A., Volume 3

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Ron M. Anderson, Bryan Tracy, John C. Bravman
Materials Research Society, 1992 - Electron microscopy - 288 pages
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Contents

TOPOGRAPHIC KINETICS AND PRACTICE OF LOW ANGLE
3
FIBXTEMFOCUSSED ION BEAM MILLING FOR TEM SAMPLE
23
PRECISION ION POLISHING SYSTEMA NEW INSTRUMENT
43
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