Microelectronic failure analysis: desk reference : 2002 supplement

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ASM International, 2002 - Education - 210 pages
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Provides new or expanded coverage on the latest techniques for microelectronic failure analysis. The CD-ROM includes the complete content of the book in fully searchable Adobe Acrobat format. Developed by the Electronic Device Failure Analysis Society (EDFAS) Publications Committee

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Contents

Investigation of a Low Voltage PWB CAF Failure
107
Application of Scanning Acoustic Microscopy to Electric and Electronic Parts
115
Chiaki Miyasaka Bernhard Tittman
125

5 other sections not shown

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