Applied Optics and Optical Engineering, Volume 9Academic Press, 1983 - Optical instruments |
Contents
GEORGE W HOPKINS 28C HewlettPackard Company Palo Alto Cali | 1 |
ERWIN G LOEWEN Bausch and Lomb Inc Rochester New York | 33 |
SCANNING SPOT MICROSCOPY FOR RECORDING | 81 |
Copyright | |
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aberration Airy disc amplitude angular astigmatism axial axis azimuth beam calculated canonical coordinates central aperture central maximum circular aperture coherent collimator color concave gratings contact lens cornea courtesy curve DATA ENTRY detector diameter diffraction pattern diopters edge ray efficiency eight-aperture energy ENTER PROMPT entrance pupil ENTRY OR COMMAND exit pupil extra-axial eyepoint focal length focus formulae GOTO groove image plane INPUT intensity laser lenses light magnification maxima mirror modelboard modulation numerical aperture optical system parameters point spread function PRINT PROMPT FOR DATA radial distance RADIANT EXITANCE radius ratio ray tracing Rayleigh Rayleigh criterion readout real-space coordinates reduced coordinates refraction refractive error relative resolution ring rotated scale ratios scanning spot screen shown in Fig simulator space Sparrow criterion spatial frequency spherical spread function square array surface telescope tion track values virtual image display visual wavelength