Noise in Solid State Devices and Circuits
Gives basic and up-to-date information about noise sources in electronic devices. Demonstrates how this information can be used to calculate the noise performance, in particular the noise figure, of electronic circuits using these devices. Optimization procedures, both for the circuits and for the devices, are then devised based on these data. Gives an elementary treatment of thermal noise, diffusion noise, and velocity-fluctuation noise, including quantum effects in thermal noise and maser noise.
7 pages matching Nyquist's theorem in this book
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admittance amplifier stage average base bias calculate capacitance carriers channel collector common emitter conductance constant correlated density device under test drain energy Englewood Cliffs equation equivalent circuit equivalent noise resistance equivalent noise temperature equivalent saturated diode evaluate figure F flicker noise fluctuating Fmin full shot noise function g-r noise GaAs gcor gmax Hence hole IEEE Trans injection input circuit integral inversion JFET l/f noise low frequencies low-frequency maser microwave mixer mobility-fluctuation MOSFET noise current noise figure noise measure noise power noise resistance noise source number-fluctuation Nyquist's theorem obtained oscillator p-n junctions p-region p+-n p+-n-p transistor parameter Phys Prentice-Hall Proc processes quantum recombination resistor saturated diode current section Ax semiconductor short-circuited shot noise shows signal silicon Solid State Electron space-charge region spectrum theorem theory thermal noise trap tuned tunnel versus voltage whereas yields zero Ziel