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0-input 0riple Acceptable Q analysis application avionics Capacitor component configuration curve defects design to cost diagram Diode effects ELECTRICAL STRESS VERSUS Electronic Equipment engineering environmental estimates evaluation factors failure modes failure rate flip-flop function gate Dual guidelines handbook hardware Inductors input inspection integrated circuits invert gate l60 TEMP low power maintenance methods microcircuits military modules MTBF N0ND gate open collector operating output parameters performance pulse QJ QJ QJ ro Quad Radar reliabil reliability engineering reliability growth reliability prediction requirements resistance resistors ro QJ ro ro Schottky screening Selection semiconductor devices shown in Figure SPACE APPLICATI0N specific standard STRESS VERSUS TEMPERATURE switching Table tantalum techniques TEMPERATURE DERATING REGI0NS test points thermal tion trade-off transient transistor VERSUS TEMPERATURE DERATING vibration Visual pre-cap voltage Wire bond worst case analysis