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Zur Vor und Friihgeschichte des Elektronenmikroskops
Illuminating systems for conventional electron microscopes
High resolution scanning microscopy
3 other sections not shown
alloys analysis angle annealing aperture atoms axis Boersch bright field Burgers vectors calculated carbon chromatic aberration coherence coil CTEM curve dark field images defects defocus deformation density detector diameter dislocation dislocation loops domain effect elastic electron beam electron diffraction electron micrographs electron optical energy loss experimental exsolution field emission Fig.l Figure film filter foil Fourier fringes function goniometer grain boundary high resolution high voltage illuminating angle intensity interstitial irradiation Japan lamellae lattice lattice image layer lenses magnetic magnification martensite material matrix measured metals method molybdenum nucleation objective lens observed obtained Optik orientation parameters particles Phys plane plasmon precipitates Proc region sample scanning electron microscope secondary electron shown in Fig shows single crystal specimen spherical aberration spots stacking fault STEM strain structure surface technique temperature thickness thin tilt tion transmission electron microscopy tungsten twin vacancy vacuum X-ray