International Test Conference 1995: Driving Down the Cost of Test : Proceedings : October 21-25, 1995, Washington, D.C. USA

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International Test Conference, 1996 - Electronic digital computers - 1011 pages
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Contents

INTRODUCTORY SECTION Welcoming Message 1 Table
7
Synthesized Transparent BIST for Detecting Scrambled
23
Deterministic SelfTest of a HighSpeed Embedded Memory
33
Copyright

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