Proceedings of the ... ACM Great Lakes Symposium on VLSI.

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ACM Press, 2005 - Integrated circuits
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Contents

Interconnect 1000 am 1200
13
S2 3S Thermal Aware CellBased FullChip Electromigration Reliability Analysis
26
S2 4S Accounting for the Skin Effect during Repeater Insertion
32
Copyright

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