Selected reprints on logic design for testability

Front Cover
IEEE Computer Society Press, 1984 - Computers - 315 pages
0 Reviews

From inside the book

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

of VLSI Multichip Modules
13
of FaultTolerance
27
Test Generation and Fault Simulation
61
Copyright

11 other sections not shown

Common terms and phrases

References to this book

All Book Search results »

Bibliographic information