Proceedings, ... Annual Meeting, Electron Microscopy Society of America, Volume 4; Volume 48, Part 4San Francisco Press, 1990 - Electron microscopes |
Contents
Structural studies of small amorphous volumes by electron diffractionP Moine | 122 |
In situ observation of solidstate amorphization in a NiTi multilayerM A Wall | 128 |
Evidence for a new quasicrystalline transition state in Al65Cu20Fe15 alloyZ Zhang N C | 134 |
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alloy amorphous analysis annealing Appl atomic austenite bright field Burgers vector calculated carbon catalyst composition contrast Copyright 1990 Copyright©1990 by San cross-section crystalline crystallites damage dark field defects deformation density deposited diffusion dislocations domain electron beam electron diffraction electron diffraction pattern energy epitaxial field image Figure formation formed fringes GaAs grain boundary growth high resolution HREM image HRTEM implanted indicated interface investigated irradiation lattice layer Lett loops magnetic martensite Materials Science matrix mechanism metal micrograph microstructure misfit modulation morphology nucleation observed obtained orientation orthorhombic oxide oxygen particles phase Phys plane precipitates Proc quasicrystal References region Research sample San Francisco Press selected area diffraction shown in Fig shows silicon simulations single crystal specimen stacking faults strain structure substrate superconducting superlattice surface symmetry technique thickness thin films tilt transformation transmission electron microscopy twin vector X-ray YBCO zeolite zone axis