Gerald F. Marshall
Taylor & Francis, Jul 19, 1991 - Technology & Engineering - 896 pages
The first three chapters cover gaussian beam characteristics, system lens design, and image quality, forming a framework that clarifies and serves the scanning process. Subsequent chapters cover the physical scanning methods holographic, polygonal, galvanometric, resonant, acoustooptic, electrooptic
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Handbook of Optical and Laser Scanning, Second Edition
Gerald F. Marshall,Glenn E. Stutz
Limited preview - 2011
Optical scanning system for surface inspection - US Patent 7075637
In an optical scanning system for detecting particles and pattern defects on a sample surface, a light beam is focused to an illuminated spot on the surface ...
www.patentstorm.us/ patents/ 7075637.html
Three-Dimensional Fluorescence Microscopy by Optical Scanning ...
Keywords: Optical Scanning Holography, 3D Imaging, 3D Fluorescence Microscopy ..... of a fluorescent specimen by optical scanning holography. ...
scholar.lib.vt.edu/ theses/ available/ etd-11597-153644/ unrestricted/ Bradphd.pdf
Fundamental architecture of optical scanning systems
Configurations for active and passive optical scanning are categorized and unified with the use ... architectural options for optical scanning and, within ...
www.optics.arizona.edu/ optomech/ references/ papers/ Beiser%201995.pdf
Optical scanning system for surface inspection - Patent Review 7075637
An optical scanning system for detection of anomalies on a surface comprising: optics directing a focused beam of radiation onto a sample surface to produce ...
re Hopkins and D. Stephenson, “Optical systems for laser scanners,” in Optical Scanning, gf Marshall, ed. (Dekker, New York, 1991), pp. ...
Optical Scanning Systems: Design and Applications, SPIE. Vol. 3131, L. Beiser and ..... axis of a prismatic polygon scanner”, in Optical Scanning ...
doi.wiley.com/ 10.1002/ 0471723738.refs
Optical scanning system for surface inspection - Patent 6888627
In an optical scanning system for detecting particles and pattern defects on a ...... An optical scanning method for detection of anomalies on a surface ...
(WO/1997/046865) OPTICAL SCANNING SYSTEM FOR SURFACE INSPECTION
One aspect of the invention is directed towards an optical scanning system for detection of anomalies, such as particles and pattern defects on a surface, ...
www.wipo.int/ pctdb/ en/ wo.jsp?IA=WO1997046865&
Dependence of transverse and longitudinal resolutions on incident Gaussian beam widths in the illumination part of optical scanning microscopy ...
SPIE, 1999 (SPIE Proceedings Series 3787) ISBN: 0-8194-3273-3 S.54-62. Conference on Optical Scanning: Design and Application <1999, Denver/Colo.> Englisch ...
publica.fraunhofer.de/ starweb/ servlet.starweb?path=pub0.web&