Electron Microscopy: Principles and Fundamentals (Google eBook)
S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo
John Wiley & Sons, Sep 26, 2008 - Technology & Engineering - 527 pages
Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:
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aberration Amelinckx amplitude analysis analyzer angle aperture Auger Auger electrons axis boundary Bragg Bragg angle bright ﬁeld Burgers vector coherent column conﬁguration contrast crystal CTEM dark ﬁeld image deﬁned defocus depth detection detector diffraction pattern domain domain walls edge effect electron beam electron diffraction electron microscopy elements emission energy factor Figure ﬁlm ﬁrst foil Fourier fringes high-resolution hologram holography HOLZ incident beam instrument intensity interface ion microprobe J. M. Cowley layer LEEM magnetic ﬁeld magniﬁcation mass mass spectrometer method Microsc microscope mode objective lens obtained optical parallel parameters particles phase Phys pixel potential probe proﬁles reciprocal lattice reﬂection result sample scanning scattering screw dislocation secondary electrons secondary ions SEMPA shown in Fig signal spatial specimen spectra spectrometer spherical aberration stacking fault STEM structure surface techniques thickness thin tion transmission electron transmission electron microscope tron Ultramicroscopy voltage wave wavefunction X-ray