Electron Microscopy: Principles and Fundamentals (Google eBook)

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S. Amelinckx, Dirk van Dyck, J. van Landuyt, Gustaaf van Tendeloo
John Wiley & Sons, Sep 26, 2008 - Technology & Engineering - 527 pages
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Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:
  • Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
  • Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
  • Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
  

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