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31 August accelerating voltage analysis analytical angle aperture application atomic calculated Cancun carbon cathode CCD camera cell chemical coefficient contrast correction crystal defocus detection detector developed diffraction pattern DIMP distribution EFTEM electron beam electron diffraction elemental maps energy filter energy loss experimental field emission Figure film Fourier function Gatan geometric phase high resolution HREM HRTEM intensity interface irradiation Japan JEOL Laboratory lattice layer linear motor magnetic magnification measured method Mexico microanalysis micrographs Microsc mrad noise objective lens observed obtained Osaka Paper presented parameters particle phase Phys pixel plane plasmon potential presented at ICEM14 quantitative Research sample scanning electron scanning electron microscope scattering scintillator secondary electron September 1998 Symposium shown in Fig shows signal simulation spatial frequency specimen spectra spectrum spherical aberration structure surface technique thickness tilt transmission electron microscopy Ultramicroscopy voltage Volume X-ray