X-ray microscopy III: proceedings of the third international conference, London, September 3-7, 1990
Alan G. Michette, Graeme R. Morrison, Christopher Buckley, Christopher J. Buckley
Springer-Verlag, 1992 - Science - 491 pages
This book deals with the latest advances in high-resolution image formation using X-rays. The main topics treated are X-rays sources and optics, X-ray imaging using a variety of contrast mechanisms, theory, and technical aspects of microscopy. Several contributions are devoted to applications, including the imaging of hydrated (live as well as fixed) biological tissue and microanalytical techniques in biology and materials science. Finally, X-ray microscopy is compared with other techniques. As an up-to-date overview of this rapidly developing field the book will be welcomed by established researchers and newcomers alike.
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Introduction to Soft XRay Microscopy
The Development of Synchrotron Radiation Sources
Soft XRay Emission from a LaserProduced Carbon Plasma
5 other sections not shown
67 X-Ray Microscopy absorption angle aperture beamline Berlin Heidelberg 1992 biological specimens Buckley carbon centriole chromosomes density detector developed diameter diffraction efficiency electron microscopy emission etching experimental exposure Figure film flux focusing Fresnel zone plates germanium Gottingen granule grating grazing incidence high resolution hologram holography Howells King's College London Kirz Laboratory laser layer linear magnification material measured membrane Michelle Microscopy III Eds microtomography mirror monochromator Morrison multilayer myofibrils object obtained Optical Sciences phase contrast phase zone plates photon photon energy photoresist Phys pinhole pixel plane plasma PMMA polyimide protein pulse radiation damage Rarback reconstruction resist sample scanning Schmahl Scries in Optical shows silicon silicon nitride spatial resolution spectral Springer Scries Springer-Vcrlag Berlin Heidelberg storage ring structure STXM substrate surface synchrotron radiation target technique thickness transmission undulator water window wavelength wet cell X-ray contact X-ray image x-ray source x—ray zone width