International Conference on Automatic Inspection and Measurement: August 20-21, 1985, San Diego, California

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Richard A. Brook, Michael J. W. Chen
SPIE--the International Society for Optical Engineering, 1985 - Technology & Engineering - 176 pages
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Contents

INTEGRATED SYSTEM DESIGN
43
INFORMATION PROCESSING
89
INDUSTRIAL NEEDS AND CASE STUDIES
131
Copyright

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