Electron microscopy and analysis 1995: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Birmingham, 12-15 September 1995
David Cherns, Institute of Physics (Great Britain). Electron Microscopy and Analysis Group, Royal Microscopical Society (Great Britain), Institute of Materials (Great Britain)
Institute of Physics Pub., 1995 - Science - 591 pages
Provides a wide-ranging survey of developments in the techniques and applications of electron microscopy, its associated analytical techniques, and the various complementary analytical and imaging methods available.
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Microanalysis at the atomic level
Energy loss spectroscopy of ironcopper multilayers
Curve fitting approach to EXELFS analysis
29 other sections not shown
1995 lOP Publishing alloy aluminium amorphous Analysis Group Conf angle annealing aperture atomic behaviour Birmingham bright field BSCCO Burgers vector calculated CBED composition contrast crystal Debye-Waller factor defects deformation density Department of Materials detector diffraction pattern diffusion edge EELS effect electron beam electron diffraction Electron Microscopy electropolishing energy loss experimental Figure filtered foil fringe function grain boundaries growth HREM increase intensity interface intermetallic lattice layer lOP Publishing Ltd Materials Science matrix measured metal method micrograph Microscopy and Analysis microstructure multilayers observed obtained orientation orthorhombic oxide oxygen Paper presented parameters particles peak Phys plane plasmon precipitates presented at Electron probe profiles ratio reflections region sample scanning scattering screw dislocation selected area diffraction shown in Fig shows silicon simulations spacing specimen spectra strain structure factors substrate superconducting surface technique thickness tilt transformation transmission electron microscope twin Ultramicroscopy values vector voltage X-ray YBCO