Image Enhancement in Electron Microscopy by Single-sideband Holographic Methods |
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Contents
IMAGE FORMATION | 10 |
THE LIGHTOPTICAL SYSTEMS | 59 |
CONVENTIONAL IMAGING AND IMAGE PROCESSING | 76 |
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amplitude component amplitude contrast amplitude modulation amplitude object angle aperture charge back focal plane carbon film coherent compensate contrast reversals contrast transfer function coordinates defocus defocus values determining the phase diffraction plane displacement double-sideband imaging effect electron microscope Figure 33 focus Fourier transform fringes gold clusters gold film grating half-plane aperture Hanszen hologram holography illumination image defect image intensity image plane image processing imaging system lens aberrations low frequency effect method modulation non-periodic objects object plane object spacings object wave objective aperture objective lens optical reconstruction system optical system periodic object phase and amplitude phase component phase contrast phase shift due plane aperture point spread function produce reconstructed image series of micrographs shown in Figure sideband image single-sideband image spatial frequencies spherical aberration spherical wave SSB image superposition transform techniques test objects Thon trans transform plane transmittance twin image wavefront weak phase object zone plates