Electron microscopy 1998: proceedings of the 14th International Congress on Electron Microscopy, Cancun (Mexico), 31 August to 4 September 1998
Héctor A. Calderón Benavides, M. José Yacamán
Institute of Physics Pub., 1998 - Science
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31 August accelerating voltage analysis analyzed applied atomic calculated Cancun carbon cathode cathodoluminescence CCD camera cell chemical contrast correction crystal defocus detection detector diffraction pattern distribution EFTEM electron beam electron crystallography electron diffraction electron holography energy filter energy loss experimental field emission Figure film Fourier function high resolution Hitachi HRTEM ICEMI4 intensity interface irradiation Japan JEOL Laboratory lattice layer linear motor magnetic magnification measured method Mexico microanalysis micrographs modulation objective lens observed obtained optical Paper presented parameters particles peak phase Phys pixel plane plasmon potential presented at ICEM14 probe Proc quantitative reconstruction References sample scanning electron scanning electron microscope scattering scintillator secondary electron September 1998 Symposium shown in Fig shows signal silicon simulated spatial specimen spectra spectrum spherical aberration structure surface technique thickness thin tilt transmission electron microscopy Ultramicroscopy University voltage Volume wave X-ray