Digest of PapersIEEE, 1980 - Integrated circuits |
Common terms and phrases
activity addition algorithm allows analysis applied approach array block cause cell chip circuit clock combinational complex components Conference contains cost cycle delay described detection determine developed device dynamic effect electron element engineering equipment example execution fail failure fault Figure filter function gate given IEEE implemented increase indicates input instruction integrated internal language logic measurement memory method mode operation output package partitioning path performance possible present problem reduce reference response sample selected sensitive sequence shift short shown shows signal simulation single soft error specific step structure Table techniques test pattern test program testability tester tion unit vector verification voltage Write