Practical Electron Microscopy |
Contents
GENERAL SURVEY 125 | 1 |
THE MAGNETIC ELECTRON MICROSCOPE | 41 |
THE ILLUMINATING SYSTEM | 71 |
Copyright | |
18 other sections not shown
Common terms and phrases
alignment aluminium angle angular aperture anode aperture astigmatism atoms axial axis beryllium bias biological BOERSCH BORRIES cathode Cavendish Laboratory centre chromatic aberration collodion condenser contrast corresponding defocusing density detail diffraction diffusion pump disk distance effect electron beam electron gun electron lenses electron microscope electrostatic electrostatic lens emission employed emulsion equation evaporation exposure field of view filament final image focal length focusing give given grid Hence high magnification high voltage illumination increase instrument intensity intermediate lens latter limit magnetic lenses magnification material maximum metal method Metropolitan Vickers micrograph normal object holder objective lens observed obtained operation optical microscope oxide particles photographic plane plate pole pieces possible practice projector pump range replica resolution resolving power rotation scattering shadowing shown in Figure specimen spherical aberration stage surface thickness tion two-stage usually vacuum variation varying viewing screen visible Ιμ