Metal/nonmetal Microsystems: Physics, Technology, and Applications, 11-14 September 1995, Polanica Zdrój, Poland |
Contents
Aging of metalhardcarbon films 278002 | 9 |
Electrical conduction in discontinuous metal thin films Invited Paper 278013 | 13 |
chosen properties and application 278005 | 18 |
Copyright | |
32 other sections not shown
Common terms and phrases
1/f noise absorption activation energy amorphous analysis annealing applied atoms band calculated capacitance cermet characteristics charge carrier coefficient concentration constant crystal curves decrease defects density deposition detector devices dielectric diode distribution DLTS doped effect electric field electrical properties electroformed Electroluminescence electrophoretic deposition emission evaporated experimental Figure frequency function GaAs glass Hall mobility hopping increase insulating interface investigated ions islands Keywords laser lattice layer magnetic field magnetostriction materials measurements method Mn films molecular multilayers noise observed obtained optical oxide oxygen precipitates parameters percolation percolation threshold phase Phys Physics PI film plasma Poland polaron polymer potential quantum quantum dot range region resistance resistors room temperature sample semiconductor sensor shows silicon spectra spectrum structure substrate superlattice surface technique Technology thermal thick film thin films Thin Solid Films transition trap tunneling University of Wrocław vacuum values voltage wavelength